Yokogawa AQ6375 Optical Spectrum Analyzer
World Class Optical Performance for Long Wavelength Applications
Product Overview
The AQ6375 is the first bench-top optical spectrum analyzer covering the long wavelength over 2 μm. It is designed for researchers and engineers who require precise measurement capabilities in these extended wavelength ranges. The analyzer delivers high-speed measurements with exceptional accuracy, resolution, and sensitivity in a compact design, featuring comprehensive analysis capabilities and a built-in calibrator.
Measurement Functions
Spectral Width and Center Wavelength Calculation
Four calculation methods available:
- THRESH method
- ENVELOPE method
- RMS method
- PEAK RMS method
Notch Width Measurement
Measures pass band width and notch width from measured waveforms of filters with V-type or U-type wavelength characteristics.
Light Source Analysis
Analyzes light source parameters from measured waveforms of DFB-LD, FP-LD, and LED sources.
PMD Measurement
Measures polarization mode dispersion (PMD) of DUTs when used with analyzer, polarization controller, polarizer, and wideband light source.
WDM Analysis
Analyzes WDM transmission signals and measures OSNR of DWDM systems with 50 GHz spacing. Supports collective measurement of up to 1024 channels.
Optical Amplifier Analysis
Measures optical amplifier gain and noise figure from input and output light waveforms.
Optical Filter Characteristics Measurement
Measures optical filter characteristics from input and output light waveforms, supporting both single-mode and multimode WDM filters.
Level Fluctuation Measurement
Measures time-based changes in specific wavelength levels, useful for optical axis alignment and stability testing.
Template Analysis
Compares preset reference data with measured waveforms and displays target spectrum for optical device adjustment.
Go/No Go Judgment
Compares active trace waveforms against reference data for pass/fail testing in production environments.
Marker and Zoom Analysis
Performs analysis of signals within boundaries selected by line markers or zoomed areas.
